by Franz-Xaver Reichl, Friedrich Slivovsky, Stefan Szeider
Reference:
eSLIM: Circuit Minimization with SAT Based Local ImprovementFranz-Xaver Reichl, Friedrich Slivovsky, Stefan Szeider27th International Conference on Theory and Applications of Satisfiability Testing (SAT 2024) (Supratik Chakraborty, Jie-Hong Roland Jiang, eds.), volume 305 of Leibniz International Proceedings in Informatics (LIPIcs), pages 23:1–23:14, 2024, Schloss Dagstuhl – Leibniz-Zentrum für Informatik.
Bibtex Entry:
@InProceedings{ReichlSlivovskySzeider24,
author = {Franz-Xaver Reichl and Friedrich Slivovsky and
Stefan Szeider},
title = {{eSLIM:} Circuit Minimization with {SAT} Based Local
Improvement},
booktitle = {27th International Conference on Theory and Applications of Satisfiability Testing (SAT 2024)},
pages = {23:1--23:14},
series = {Leibniz International Proceedings in Informatics (LIPIcs)},
year = {2024},
volume = {305},
editor = {Chakraborty, Supratik and Jiang, Jie-Hong Roland},
publisher = {Schloss Dagstuhl -- Leibniz-Zentrum f{\"u}r Informatik},
address = {Dagstuhl, Germany},
doi = {10.4230/LIPIcs.SAT.2024.23},
keywords = {strides},
}